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Simulations of the x-ray imaging capabilities of the silicon drift detectors (SDD) for the LOFT wide-field monitor
Author/s
author: Luigi Pacciani, Riccardo Campana, Marco Feroci, Søren Brandt, Andrea Vacchi, Yuri Evangelista, Margarita Hernanz, Paolo Soffitta, Immacolata Donnarumma
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Publication date
September 7, 2012
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