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The butterfly - a well-defined constant-current topography pattern on Si(001):H and Ge(001):H resulting from current-induced defect fluctuations
scientific article published on 4 July 2016
Author/s
author: Thomas Frederiksen, Mads Engelund, Marek Kolmer, Daniel Sánchez-Portal, Bartosz Such, Marek Szymoński, Rafał Zuzak, Szymon Godlewski
Work details
Publication date
July 4, 2016
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Language
English
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