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Depth profiling charge accumulation from a ferroelectric into a doped Mott insulator
scientific article published on 17 March 2015
Author/s
author: Manuel Bibes, Slavomir Nemsak, Hiroyuki Yamada, Jean-Pascal Rueff, Agnès Barthélémy
Work details
Publication date
March 17, 2015
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Language
English
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