Missing/wrong data?
Log in to edit
Defect Studies in Thin-Film SiO2 of a Metal-Oxide-Silicon Capacitor Using Drift-Assisted Positron Annihilation Lifetime Spectroscopy
scientific article published on 23 July 2025
Author/s
author: Maik Butterling, Andreas Wagner, Maciej Oskar Liedke, Kangho Lee, Georg S. Duesberg
Work details
Publication date
July 23, 2025
-
-
Language
English
Copyright status
Copyright status information is not available for this work. The copyright status depends on the jurisdiction, the author's date of death and the date the work was created or published.
To learn more about copyright terms in different countries, visit the countries and terms page.